Thin films of Eu(TTA)_3(phen), which was known to show red-light emitting properties, were deposited under various deposition condition. The thickness, surface morphology, and photoluminescence(PL) were measured with α-step profiler, Atomic Force Microscopy(AFM), and PL measurement apparatus. It was found that the thickness of Eu(TTA)_3(phen) film can be controlled precisely by adjusting the amounts of Eu(TTA)_3(phen) in the boat. As the thickness of these films increases, the surface roughness also increases. A structure of Al/Eu(TTA)_3(phen)*(50A°)/TPD(600A°)/ITO was fabricated, Electroluminescence(EL) spectrum of which shows the peak at the wavelength of 618nm.