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Solution-Processed Al2O3 확산층을 이용한 Sputtering IZO Thin Film Transistor의 안정성 향상
Improved Stability Sputtered IZO Thin Film Transistor Using Solution Processed Al2O3 Diffusion Layer
황남경 ( Namgyung Hwang ) , 임유성 ( Yooseong Lim ) , 이정석 ( Jeong Seok Lee ) , 이세형 ( Sehyeong Lee ) , 이문석 ( Moonsuk Yi )
UCI I410-ECN-0102-2018-500-003856779

This research introduces the sputtered IZO thin film transistor (TFT) with solution-processed Al2O3 diffusion layer. IZO is one of the most commonly used amorphous oxide semiconductor (AOS) TFT. However, most AOS TFTs have many defects that degrade performance. Especially oxygen vacancy in the active layer. In previous research, aluminum was used as a carrier suppressor by binding the oxygen vacancy and making a strong bond with oxygen atoms. In this paper, we use a solution-processed Al2O3 diffusion layer to fabricate stable IZO TFTs. A double-layer solution-processed Al2O3-sputtered IZO TFT showed better performance and stability, compared to normal sputtered IZO TFT.

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3. 결과 및 고찰
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[자료제공 : 네이버학술정보]
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