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전자부품의 새로운 절연평가기법 연구
A Study on the New Evaluation Method on Insulation of Electronic Components
길경석 ( Gyung Suk Kii ) , 송재용 ( Jae Yong Snog ) , 문승보 ( Seung Bo Moon ) , 차명수 ( Myung Soo Cha )
UCI I410-ECN-0102-2015-500-001795460
이 자료는 4페이지 이하의 자료입니다.

This paper describes a low-level partial discharge(PD) testing that has been accepted as a non-destructive test method on insulation performance of electronic components. A comparative PD analysis combined with the Withstand Voltage Test (WVT) specified in IEC standards is carried out on high frequency switching transformers. The analysis shows that insulation degradation of the transformers under test progresses during the WVT. To avoid insulation degradation of the specimen, PD test has to be carried out at as low voltage as possible. In this study, the PD test on the transformers is performed in ranges from 50% to 70% of the test voltage specified in the WVT by measuring apparent charges below 1 pC. From the experimental results, it is expects that the low-level PD test is applicable for electronic components as a replacement of the WVT.

[자료제공 : 네이버학술정보]
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