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MOCVD로 증착된 Bi4Ti3O12 박막의 미세구조와 강유전성에 Cerium 첨가가 미치는 영향
The Effect of Ce Substitution on Microstructure and Ferroelectric Properties of Bi4Ti3O12 Thin Films Prepared by MOCVD
강동균 ( Dong Kyun Kang ) , 박원태 ( Won Tae Park ) , 김병호 ( Byong Ho Kim )
UCI I410-ECN-0102-2015-500-001804344
이 자료는 4페이지 이하의 자료입니다.

Ferroelectric Cerium-substituted Bi4Ti3O12 thin films with a thickness of 200 nm were deposited using the liquid delivery metal organic chemical vapor deposition process onto a Pt(111)/Ti/SiO₂/Si(100) substrate. At annealing temperature above 600℃, the BCT thin films became crystallized and exhibited a polycrystalline structure. The BCT thin film annealed at 720℃ showed a large remanent polarization (2Pr) of 44.56 uC/cm2 at an applied voltage of 5V. The BCT thin film exhibits a good fatigue resistance up to 1x10 11 switching cycles at a frequency of 1 MHz with applied electric field of ±5 V.

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