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CeO2 완충층의 두께가 Al2O3 기판 위에 성장된 YBa2Cu3O7-δ 박막의 초전도 특성에 미치는 영향
Effect of CeO2 buffer layer thickness on superconducting properties of YBa2Cu3O7-δ films grown on Al2O3 substrates
임해용(Hae Ryong Lim), 김인선(In Seon Kim), 김동호(Dong Ho Kim), 박용기(Yong Ki Park), 박종철(Jong Chul Park)
센서학회지 8권 2호 195-201(7pages)
UCI I410-ECN-0102-2008-530-001326955
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C-axis oriented YBa₂Cu₃O_(7-δ) (YBCO) thin films were grown on Al₂O₃ (alumina and R-plane sapphire) substrates by a pulsed laser deposition method. The crystallinity of the CeO₃ buffer layer on sapphire substrate exhibit a strong dependence on the deposition temperature, resulting in the growth of a-axis orientation at 800 ℃. The superconducting properties of YBCO thin films on Al₂O₃ substrates showed strong dependence on both thickness and crystallinity of the CeO₂ buffer layer. Critical temperature of YBCO film on alumina substrate was ∼83 K. In the case of R-plane sapphire substrate.

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