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전기적화상에 의한 구순결손의 재건 - 증례보고
The Reconstruction of the Lip Defect due to Electrical Burn ( Case Report )
김병린(Kyoung Won Kim),김경원(Byeong Rin Kim),박진규(Jin Kyu Park),민병일(Byong Il Min)
UCI I410-ECN-0102-2009-510-004071906

Electrical burns of the lips are most frequently seen in small children, who are apt to chew on electrical cords or plug the ends of extension cords in their mouth, saliva creates a short circuit across the terminals within the plug, causing an electrical bum Tissue destruction with electrical burns is sudden and extensive. Extensive, deep coagulation necrosis is instaneously produced by the extreme temparatures of electrical arc. If the child is well grounded, the circuit flaw through his body may cause cardiac arrest. The purpose of this report is to document two cases of electrical lip burn and reconstruction of the lip defect with some local flap techniques For case 1, Z plasty & V -Y plasty and lengthening of the commissure and in case 2, Abbe flap technique was used and scar was revised later. Z - plasty and V - Y plastry were used for scar release and Abbe flap was designed on lower hp to meet the need of upper lip. For short of right lip width, lengthening of the commissure was done. We are to report the improvement with forementioned operation on the patient of electrical burn upon the lip.

[자료제공 : 네이버학술정보]
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