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18.97.14.87
18.97.14.87
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반도체 및 VLSI : 액상 증착법을 이용한 SiO2 막의 형성과 소자응용에 관련된 기초 특성
Semiconductor and VLSI : Studies on the Formation of SiO2 Films Using Liquid Phase Deposition Method and Their Basic Characteristics Related with the Application to Electronic Devices
이상국(S . K . Lee),최재혁(J . H . Choi),최형봉(H . B . Choi),김철주(C . J . Kim)
UCI I410-ECN-0102-2009-560-006548346
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