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ENG
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대한금속재료학회
대한금속재료학회 학술대회 개요집
Stress-related Reliability Problems of Passivation-layer Materials in DRAM devices
Stress-related Reliability Problems of Passivation-layer Materials in DRAM devices
Seong Min Lee
대한금속재료학회
1997.01
대한금속재료학회 학술대회 개요집
vol. 1997 iss. 1
84-84(1pages)
UCI
I410-ECN-0102-2009-580-007443797
₩ 1,000
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