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18.97.9.171
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ENG
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대한금속재료학회
Advanced Material and Processing
A HIGH RESOLUTION ELECTRON MICROSCOPIC STUDY OF CROSS - SECTIONAL DIAMOND FILM ON Si SUBSTRATE
A HIGH RESOLUTION ELECTRON MICROSCOPIC STUDY OF CROSS - SECTIONAL DIAMOND FILM ON Si SUBSTRATE
Z . Zhang , L . X . Wang , J . Yang , Z . Lin
대한금속재료학회
1995.01
Advanced Material and Processing
vol. 2
1081-1088(8pages)
UCI
I410-ECN-0102-2009-580-007366846
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