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18.97.14.84
한국어
ENG
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대한금속재료학회
Semiconductor Wafor Cleaning and Surface Characterization
HgCdTe 반도체의 계면결함분석
HgCdTe 반도체의 계면결함분석
Interface Defect Analysis of HgCdTe Semiconductor
서상희 ( Sang Hee Suh ) , 임성욱 ( Sung Wook Lim ) , 최인훈 ( In Hoon Choi )
대한금속재료학회
1992.01
Semiconductor Wafor Cleaning and Surface Characterization
vol. 0
150-161(12pages)
UCI
I410-ECN-0102-2009-580-007389161
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