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한국전기전자재료학회
전기전자재료학회논문지
t - ws 고장 검출을 위한 테스트 방법의 개선
t - ws 고장 검출을 위한 테스트 방법의 개선
Improvement of Test Method for t - ws Fault Detect
김철운 , 김영민 , 김태성 ( Cheol Woon Kim , Young Min Kim , Tae Sung Kim )
한국전기전자재료학회
1997.01
전기전자재료학회논문지
vol. 10 iss. 4
349-354(5pages)
UCI
I410-ECN-0102-2008-560-002001937
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