Characterizations of MONOS Structures with a Superthin Nitride Film for the Low Voltage NVSM Using TSC Techniques

Sang Bae Yi , Sam Kyung Kuk , Sang Eun Lee , Byung Cheul Kim , Kwang Yell Seo

한국전기전자재료학회 1997.01

Proceedings of the 5th International Conference vol. 1997 iss. 1 940-942(3pages)

UCI I410-ECN-0102-2008-560-002002429

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[자료제공 : 네이버학술정보]