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한국전기전자재료학회 Proceedings of the 5th International Conference Investigation of Basic Optical Characteristics in Te - Ge Binary Thin Films for the Optical Memory
Investigation of Basic Optical Characteristics in Te - Ge Binary Thin Films for the Optical Memory
Young Jong Lee , Hong Seok Kim , Hong Bay Chung
한국전기전자재료학회 1997.01
Proceedings of the 5th International Conference vol. 1997 iss. 1 631-634(4pages)
UCI I410-ECN-0102-2008-560-002003204
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