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18.97.9.172
한국어
ENG
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한국전기전자재료학회
Proceedings of the 5th International Conference
Reliability of Microcircuits through Partial Discharge Measurements
Reliability of Microcircuits through Partial Discharge Measurements
R . S . D . Wahidabanu , M . A . Panneer Selvam , K . Udayakumar
한국전기전자재료학회
1997.01
Proceedings of the 5th International Conference
vol. 1997
287-289(3pages)
UCI
I410-ECN-0102-2008-560-002004074
₩ 1,000
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