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한국전기전자재료학회 Proceedings of the 5th International Conference A Novel Method for Measuring Dielectric Surface Charge Density by means of Pockels Effect and Optical phase Compensation
A Novel Method for Measuring Dielectric Surface Charge Density by means of Pockels Effect and Optical phase Compensation
Zhang Ping , Zhang Kaixi
한국전기전자재료학회 1997.01
Proceedings of the 5th International Conference vol. 1997 102-105(4pages)
UCI I410-ECN-0102-2008-560-002004514
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